bibtex形式での発表文献の紹介です．発表順に並んでいます．
@article{Yanagisawa21,
author = "柳澤 佑太 and 松浦 亮太 and 大谷 真弘 and 芦原 佑樹 and 岩田 大志 and 土井 滋貴 and 中村 篤人 and 福岡 寛 and 須田 敦 and 安藤 正明 and 笹岡 元信 and 飯田 賢一",
title = "傾斜果樹園における電動作業台車兼運搬車の無人運搬システム",
journal = "産業応用工学会論文誌",
volume = "9",
number = "2",
pages = "107--117",
month = "September",
year = "2021"
}
@article{Koga20JCMSI,
author = "Takashi Koga and Ken'ichi Yamaguchi and Hiroshi Iwata and Ikusaburo Kurimoto",
title = "Kriging Interpolation Evaluation of Vapor Pressure Deficit in Plant Factory with Solar Light",
journal = "SICE Journal of Control, Measurement, and System Integration",
volume = "13",
number = "3",
pages = "131--137",
month = "May",
year = "2020"
}
@article{Ishizaka19IEICE,
author = "石坂守 and 山口賢一 and 岩田大志",
title = "レースフリーでかつO(n)な非同期式スキャンパステスト法",
journal = "電子情報通信学会論文誌A",
volume = "J102-A",
number = "6",
pages = "172--181",
month = "June",
year = "2019"
}
For English paper
@article{Ishizaka19IEICE,
author = "Mamoru Ishizaka and Ken'ichi Yamaguchi and Hiroshi Iwata",
title = "Race-Free O(n) Scan Path Self-Test for Asynchronous Circuit",
journal = "IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences",
volume = "J102-A",
number = "6",
pages = "172--181",
month = "June",
year = "2019"
}
@techreport{Tobisawa18SICE-SI,
title = "太陽光型植物工場の水蒸気飽差制御における環境データの多点リアルタイム計測IoTシステムの構築",
author = "飛澤雄己 and 渡邊孝一 and 栗本育三郎 and 岩田大志",
booktitle = "第19回 計測自動制御学会システムインテグレーション部門講演会",
pages = "1128--1131",
month = "December",
year = "2018"
}
For English paper
@techreport{Tobisawa18SICE-SI,
title = "An IoT System for Multi-point Real-time Measurement of Environmental Data to Control Vapour Pressure Deficit in Plant Factory with Solar Light",
author = "Yuki Tobisawa and Koichi Watanabe and Ikusaburo Kurimoto and Hiroshi Iwata",
booktitle = "19th SICE System Integration Devision Annual Conference",
pages = "1128--1131",
month = "December",
year = "2018"
}
@article{Kakazu18SICE,
author = "Yuko Kakazu and Hiroshi Iwata and Ikusaburo Kurimoto and Daichi Moriuchi",
title = "Development of the Handy Type LIF System",
journal = "Proceedings of the SICE Annual Conference 2018",
number = "ThCPo03.4",
pages = "1267--1268",
month = "September",
year = "2018"
}
@article{Iwata18SICE,
author = "Hiroshi Iwata and Ikusaburo Kurimoto",
title = "Active Sensing Platform for Mathematical Analysis in Plant Factory with Solar Light",
journal = "Proceedings of the SICE Annual Conference 2018",
number = "ThCPo03.6",
pages = "1273--1275",
month = "September",
year = "2018"
}
@techreport{Iwata17SICE-SI,
title = "太陽光型植物工場の水蒸気飽差制御における環境データの空間分布推定IoTシステムの構築",
author = "岩田大志 and 鵜重誠 and 栗本育三郎",
booktitle = "第18回 計測自動制御学会システムインテグレーション部門講演会",
pages = "267--272",
month = "December",
year = "2017"
}
For English paper
@techreport{Iwata17SICE-SI,
title = "An IoT System for Space Distribution Estimation of Environment Data to Control Vapour Pressure Deficit in Plant Factory with Solar Light",
author = "Hiroshi Iwata and Makoto Uju and Ikusaburo Kurimoto",
booktitle = "18th SICE System Integration Devision Annual Conference",
pages = "267--272",
month = "December",
year = "2017"
}
@article{Iwata17IEICE,
title = "Formal Verification-Based Redundancy Identification of Transition Faults with Broadside Scan Tests",
author = "Hiroshi IWATA and Nanami KATAYAMA and Ken'ichi YAMAGUCHI",
journal = "IEICE Transactions on Information and Systems",
volume = "E100.D",
number = "6",
pages = "1182-1189",
month = "June",
year = "2017"
}
日本語論文用
@article{Hara15FIT,
author = "原一 彰 and 山口 賢一 and 岩田 大志",
title = "屈折数および交差数による論理回路図の視認性評価法",
booktitle = "情報科学技術フォーラム講演論文集",
volume = "14",
number = "1",
pages = "55--60",
month = "September",
year = "2015"
}
For English paper
@article{Hara15FIT,
author = "Kazuaki Hara and Ken'ichi Yamaguchi and Hiroshi Iwata",
title = "Logical Circuit Visibility Defined with \"Flexion\" and \"Cross\"",
booktitle = "Forum on Information Technology",
volume = "14",
number = "1",
pages = "55--60",
month = "September",
year = "2015"
}
日本語論文用
@article{Yoshida15FIT,
author = "吉田 拓弥 and 里中 沙矢香 and 山口 賢一 and 岩田 大志",
title = "BIST環境下におけるメルセンヌ・ツイスタアルゴリズムの評価",
booktitle = "情報科学技術フォーラム一般講演論文集",
volume = "14",
number = "1",
pages = "269--270",
month = "September",
year = "2015"
}
For English paper
@article{Yoshida15FIT,
author = "Takuya Yoshida and Sayaka Satonaka and Ken'ichi Yamaguchi and Hiroshi Iwata",
title = "Adopting Mersenne Twister Algorithm as Test Pattern Generator under BIST",
booktitle = "Forum on Information Technology",
volume = "14",
number = "1",
pages = "269--270",
month = "September",
year = "2015"
}
日本語論文用
@techreport{Komatsu14DC,
author = "小松 巡 and 岩田 大志 and 山口 賢一",
title = "モジュール間結合増加率に基づくスキャンチェーン接続法",
booktitle = "信学技報 (DC2013-79)",
volume = "113",
number = "430",
pages = "1--5",
month = "February",
year = "2014"
}
For English paper
@techreport{Komatsu14DC,
author = "Meguru Komatsu and Hiroshi Iwata and Ken'ichi Yamaguchi",
title = "Module Coupling Overhead Aware Scan Chain Construction",
booktitle = "IEICE Tech. Rep. (DC2013-79)",
volume = "113",
number = "430",
pages = "1--5",
month = "February",
year = "2014"
}
日本語論文用
@techreport{Mizutani14DC,
author = "水谷 早苗 and 岩田 大志 and 山口 賢一",
title = "非同期式QDI回路における任意の故障に対する検出手法",
booktitle = "信学技報 (DC2013-81)",
volume = "113",
number = "430",
pages = "13--18",
month = "February",
year = "2014"
}
For English paper
@techreport{Mizutani14DC,
author = "Sanae Mizutani and Hiroshi Iwata and Ken'ichi Yamaguchi",
title = "A DFT Method to Achieve 100% Fault Coverage for QDI Asynchronous Circuit ",
booktitle = "IEICE Tech. Rep. (DC2013-81)",
volume = "113",
number = "430",
pages = "13--18",
month = "February",
year = "2014"
}
日本語論文用
@techreport{Ryou14DC,
author = "小河 亮 and 岩田 大志 and 山口 賢一",
title = "DCSTP回路に対する最適電力テストパターン順序付け手法",
booktitle = "信学技報 (DC2013-82)",
volume = "113",
number = "430",
pages = "19--24",
month = "February",
year = "2014"
}
For English paper
@techreport{Ryou14DC,
author = "Ryou Ogawa and Hiroshi Iwata and Ken'ichi Yamaguchi",
title = "Suitable Power-Aware Test Pattern Ordering for Deterministic Circular Self Test Path",
booktitle = "IEICE Tech. Rep. (DC2013-82)",
volume = "113",
number = "430",
pages = "19--24",
month = "February",
year = "2014"
}
日本語論文用
@techreport{Sayaka14DC,
author = "里中 沙矢香 and 岩田 大志 and 山口 賢一",
title = "メルセンヌ・ツイスタアルゴリズムにもとづいた効果的なテストパターン生成器の提案",
booktitle = "信学技報 (DC2013-86)",
volume = "113",
number = "430",
pages = "43--48",
month = "February",
year = "2014"
}
For English paper
@techreport{Sayaka14DC,
author = "Sayaka Satonaka and Hiroshi Iwata and Ken'ichi Yamaguchi",
title = "An Efficient Test Pattern Generator based on Mersenne Twister algorithm",
booktitle = "IEICE Tech. Rep. (DC2013-86)",
volume = "113",
number = "430",
pages = "43--48",
month = "February",
year = "2014"
}
@article{Ueoka13WRTLT,
author = "Shin'ya Ueoka and Hiroshi Iwata and Ken'ichi Yamaguchi",
title = "Tree-focused Graph Bipartition for Asynchronous L1L2* Scan Design",
journal = "14th IEEE Workshop on RTL and High Level Testing",
number = "IV.3.F",
pages = "1--6",
month = "Nov",
year = "2013"
}
@article{Ogawa13WRTLT,
author = "Ryo Ogawa and Hiroshi Iwata and Ken'ichi Yamaguchi",
title = "Threshold Power-Aware Test Pattern Ordering for Deterministic Circular Self Test Path",
journal = "14th IEEE Workshop on RTL and High Level Testing",
number = "III.5.S",
pages = "1--4",
month = "Nov",
year = "2013"
}
@article{Satonaka13SASIMI,
author = "Hiroshi Iwata and Sayaka Satonaka and Ken'ichi Yamaguchi",
title = "An Efficient Test Pattern Generator -Mersenne Twister-",
journal = "The 18th Workshop on Synthesis And System Integration of Mixed Information Technologies",
number = "R1-12",
pages = "62--67",
month = "Oct",
year = "2013"
}
@article{Iwata10ATS,
author = "Hiroshi Iwata and Satoshi Ohtake and Michiko Inoue and Hideo Fujiwara",
title = "Bipartite full scan design: a DFT method for asynchronous circuits",
journal = "IEEE 19th Asian Test Symposium",
pages = "206--211",
month = "Dec",
year = "2010"
}
@article{Iwata10Journal,
author = "Hiroshi Iwata and Satoshi Ohtake and Hideo Fujiwara",
title = "A method of path mapping from {RTL} to gate level and its application to false path identification",
journal = "IEICE Trans. on Information and Systems",
volume = "E93-D",
number = "7",
pages = "1046--1054",
month = "July",
year = "2010"
}
日本語論文用
@techreport{Iwata10DC,
author = "岩田 大志 and 大竹 哲史 and 井上 美智子 and 藤原 秀雄",
title = "A full scan design method for asynchronous sequential circuits based on {C}-element scan paths",
booktitle = "信学技報 (DC2010-8)",
volume = "110",
number = "106",
pages = "1--6",
month = "June",
year = "2010"
}
For English paper
@techreport{Iwata10DC,
author = "Hiroshi Iwata and Satoshi Ohtake and Michiko Inoue and Hideo Fujiwara",
title = "A full scan design method for asynchronous sequential circuits based on {C}-element scan paths",
booktitle = "IEICE Tech. Rep. (DC2010-8)",
volume = "110",
number = "106",
pages = "1--6",
month = "June",
year = "2010"
}
@inproceedings{Taketani10ETS,
author = "Michiko Inoue and Akira Taketani and Tomokazu Yoneda and Hiroshi Iwata and Hideo Fujiwara",
title = "Test Pattern Selection to Optimize Delay Test Quality with a Limited Size of Test Set",
booktitle = "15th IEEE European Test Symposium (ETS'10)",
pages = "260",
month = "May",
year = "2010"
}
@inproceedings{Ohtake10DDECS,
author = "Satoshi Ohtake and Hiroshi Iwata and Hideo Fujiwara",
title = "A synthesis method to propagate false path information from {RTL} to gate level",
booktitle = "The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2010",
pages = "197--200",
month = "April",
year = "2010"
}
@inproceedings{Iwata10DELTA,
author = "Hiroshi Iwata and Satoshi Ohtake and Hideo Fujiwara",
title = "Enabling False Path Identification from RTL for Reducing Design and Test Futileness",
booktitle = "The 5th IEEE International Symposium on Electronic Design, Test & Applications (DELTA 2010)",
pages = "20--25",
month = "January",
year = "2010"
}
@inproceedings{Taketani10RASDAT,
author = "Michiko Inoue and Akira Taketani and Tomokazu Yoneda and Hiroshi Iwata and Hideo Fujiwara",
title = "Optimizing Delay Quality with a Limited Size of Test Set",
booktitle = "Proc. IEEE International Workshop on Reliability Aware System Design and Test (RASDAT 2010)",
pages = "46--51",
month = "January",
year = "2010"
}
@inproceedings{Iwata08WRTLT,
author = "Hiroshi Iwata and Satoshi Ohtake and Hideo Fujiwara",
title = "An approach to {RTL-GL} path mapping based on functional equivalence",
booktitle = "9th IEEE Workshop on RTL and High Level Testing (WRTLT'08)",
pages = "63--68",
month = "November",
year = "2008"
}
日本語論文用
@techreport{Iwata08VLD,
author = "岩田 大志 and 大竹 哲史 and 藤原 秀雄",
title = "機能等価性情報を用いた{RTL-GL}パスマッピングの一手法",
booktitle = "信学技報 (VLD2008-34)",
volume = "108",
number = "107",
pages = "13--18",
month = "June",
year = "2008"
}
For English paper
@techreport{Iwata08VLD,
author = "Hiroshi Iwata and Satoshi Ohtake and Hideo Fujiwara",
title = "An approach to {RTL-GL} path mapping based on functional equivalence",
booktitle = "IEICE Tech. Rep. (VLD2008-34)",
volume = "108",
number = "107",
pages = "13--18",
month = "June",
year = "2008"
}