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奈良工業高等専門学校 情報工学科 准教授

氏名
岩田 大志(いわた ひろし) (博士・工学)
住所
639-1080 奈良県大和郡山市矢田町22番地
連絡先
E-mail: / Tel: 0743-55-6138 / Fax: 0743-55-6149

Education

Experience

校務については校務履歴のページへ

Research

論文誌

査読付き国際会議

The Workshop on Emerging Test Technologies (ETT) embedded in the 34th Asian Test Symposium (ATS2025) (Dec. 19, 2025)
  • Saki Sugiyama, Hiroshi Iwata, and Ken’ichi Yamaguchi, ``RTL Testability for RTL Datapath Based on Network Centrality '', in Proceedings of The Workshop on Emerging Test Technologies (ETT) embedded in the 34th Asian Test Symposium (ATS2025), ETT1-3, pp.1--6, Dec. 2025.
  • Hiroaki Shimaoka, Hiroshi Iwata, and Ken’ichi Yamaguchi, ``A simple full scan design using scan C flip-flop for asynchronous circuit'', in Proceedings of The Workshop on Emerging Test Technologies (ETT) embedded in the 34th Asian Test Symposium (ATS2025), ETT2-2, pp.1--6, Dec. 2025.
The 13th IIAE International Conference on Industrial Application Engineering 2025 (Mar. 26-30, 2025)
  • Shota Sawada, Ayato Yoshida, Hiroshi Iwata, and Kenichi Yamaguchi: ``Proposal for an Animal Position and Behavior Detection System using Infrared Pyroelectric Sensors in an Animal Damage Countermeasure System,'' Proceedings of the 13th IIAE International Conference on Industrial Application Engineering 2025, PS1-2, pp.9--13, Mar. 2025.
  • Saki Sugiyama, Ken'ichi Yamaguchi, and Hiroshi Iwata: ``Consideration for the Relationship between LSI Testability and Centrality Measures in Network Analysis,'' Proceedings of the 13th IIAE International Conference on Industrial Application Engineering 2025, PS1-3, pp.14--21, Mar. 2025.
  • Hiroaki Shimaoka, Hiroshi Iwata, and Kenichi Yamaguchi: ``An Implementation of Standard Cell C-element and Scan C-element,'' Proceedings of the 13th IIAE International Conference on Industrial Application Engineering 2025, PS1-5, pp.27--33, Mar. 2025.

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