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奈良工業高等専門学校 情報工学科 准教授

氏名
岩田 大志(いわた ひろし) (博士・工学)
住所
639-1080 奈良県大和郡山市矢田町22番地
連絡先
E-mail: / Tel: 0743-55-6138 / Fax: 0743-55-6149

Education

Experience

校務については校務履歴のページへ

Research

論文誌

査読付き国際会議

The 14th IIAE International Conference on Industrial Application Engineering 2026 (Mar. 26-30, 2026)
  • Hiroshi Iwata, Shota Sawada, and Kenichi Yamaguchi: ``A PCB Design for Infrared Pyroelectric Sensor Node for Destructive Animals Damage Prevention,'' Proceedings of the 14th IIAE International Conference on Industrial Application Engineering 2026, PS2, Mar. 2026.
  • Kentaro Inoue, Hiroshi Iwata, and Kenichi Yamaguchi: ``A Comparative Study of Monolithic and Chiplet CPU Architectures: Performance and Yield Perspectives,'' Proceedings of the 14th IIAE International Conference on Industrial Application Engineering 2026, PS3, Mar. 2026.
  • Kyosuke Nishizawa, Kentaro Inoue, Saki Sugiyama, Tatsuro Taniyama, Shanon Yamaguchi, Hiroshi Iwata, and Kenichi Yamaguchi: ``Implementation and Evaluation of a Hybrid RAG-based AI Avatar onRaspberry Pi 5 with External GPU,'' Proceedings of the 14th IIAE International Conference on Industrial Application Engineering 2026, PS4, Mar. 2026.
  • Tatsuro Taniyama, Hinato Kuwahata, Kyosuke Nishizawa, Shanon Yamaguchi, Akihiro Shimaoka, Hiroshi Iwata, Kenichi Yamaguchi, and Yuki Ashihara: ``Contour Line Leveling for Beginners: An Affordable System for Visualizing Elevation Differences in Rice Fields,'' Proceedings of the 14th IIAE International Conference on Industrial Application Engineering 2026, PS5, Mar. 2026.
  • Shota Sawada, Hiroshi Iwata, and Kenichi Yamaguchi: ``Tracking Animal Movement Paths Using Multi-Node Infrared Pyroelectric Sensor Network for Low-Cost Wildlife Damage Prevention,'' Proceedings of the 14th IIAE International Conference on Industrial Application Engineering 2026, GS4-1, Mar. 2026.
The Workshop on Emerging Test Technologies (ETT) embedded in the 34th Asian Test Symposium (ATS2025) (Dec. 19, 2025)
  • Saki Sugiyama, Hiroshi Iwata, and Ken’ichi Yamaguchi, ``RTL Testability for RTL Datapath Based on Network Centrality '', in Proceedings of The Workshop on Emerging Test Technologies (ETT) embedded in the 34th Asian Test Symposium (ATS2025), ETT1-3, pp.1--6, Dec. 2025.
  • Hiroaki Shimaoka, Hiroshi Iwata, and Ken’ichi Yamaguchi, ``A simple full scan design using scan C flip-flop for asynchronous circuit'', in Proceedings of The Workshop on Emerging Test Technologies (ETT) embedded in the 34th Asian Test Symposium (ATS2025), ETT2-2, pp.1--6, Dec. 2025.

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